University of Wisconsin Madison
Testing and Testable Design of Digital Systems (E C E 553) Syllabus
Course Learning Outcomes
    Course Learning Outcome
  • 1
    Students will be able to generate test vectors for complex digital (combi-national and sequential) circuits
  • 2
    To understand and develop algorithms for automatic test pattern generation; and to be able to design circuits so that they are easy to test or can test themselves.
Testing and Testable Design of Digital Systems
E C E 553 ( 3 Credits )
Faults and fault modeling, test equipment, test generation for combinational and sequential circuits, fault simulation, memory and microprocessor testing, design for testability, built-in self-test techniques, and fault location.
ECE/Comp Sci 352; Comp Sci 367; ECE 353 or cons inst
College: College of Engineering
Instructor Name
Instructor Campus Address
Contact Hours
Course Coordinator
Text book, title, author, and year
Essentials of Electronic Testing for Digital, Memory & Mixed-Signal VLSI Circuits; M. L. Bushnell and V. D. Agraw; 1st edition; 2000
Supplemental Materials
Notes from Bob’s Copy Shop.
Required / Elective / Selected Elective
Selected Elective
ABET Program Outcomes Associated with this Course
Program Specific Student Outcomes
Brief List of Topics to be Covered
  1. Test Economics
  2. Fault Modeling and Fault Simulation
  3. Test Generation Algorithms
  4. Functional testing including Memory testing
  5. Design for Testability including boundary scan
  6. Built-In Self-Test
  7. Test Techniques (such as Iddq testing)
  8. Analog testing (time permitting)
Additional Information
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