Testing and Testable Design of Digital Systems (E C E 553) Syllabus
Course Learning Outcomes
Course Learning Outcome
Students will be able to generate test vectors for complex digital (combi-national and sequential) circuits
To understand and develop algorithms for automatic test pattern generation; and to be able to design circuits so that they are easy to test or can test themselves.
Testing and Testable Design of Digital Systems
E C E 553
( 3 Credits )
Faults and fault modeling, test equipment, test generation for combinational and sequential circuits, fault simulation, memory and microprocessor testing, design for testability, built-in self-test techniques, and fault location.